DETERMINATION OF SPONTANEOUS EMISSION RATE AND CARRIER RECOMBINATION CHANNELS IN GaInAsSb/AlGaAsSb MULTIPLE QUANTUM WELL LASER DIODES EMITTING NEAR 2.3 µm

Authors

  • K. S. Gadedjisso-Tossou The Abdus Salam International Centre for Theoretical Physics, Strada Costiera 11, Trieste, Italy
  • M. M. Dzagli Laboratoire de Physique des Composants à Semi-conducteurs (LPCS), Département de physique, FDS, Université de Lomé, 01 BP 1515 Lomé, Togo
  • M. A. Mohou Laboratoire de Physique des Composants à Semi-conducteurs (LPCS), Département de physique, FDS, Université de Lomé, 01 BP 1515 Lomé, Togo
  • Y. Rouillard Institut d’Electronique du Sud, Univ. Montpellier, CNRS, IES, UMR 5214, F-34000 Montpellier, France

DOI:

https://doi.org/10.4314/jfas.v11i2.23

Keywords:

Keywords: Amplified spontaneous emission; Spontaneous emission; Gain; Recombination.

Abstract

In this paper, Amplified spontaneous emission spectra is used to extract the gain and internal loss of 2.3 µm narrow ridge-waveguide GaInAsSb-AlGaAsSb quantum well laser diodes by Cassidy’s method. The spontaneous emission intensity was extracted using the average value of the amplified spontaneous emission intensity. The dependence of the integrated spontaneous emission intensity on injection current has been studied. The results show that the current is dominated by radiative recombination at this emission wavelength.

 

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References

[1] Werle P. Infrared Physics and Technology. 37, 1996, 59-66, http://dx.doi.org/10.1016/1350-4495(95)00113-1
[2] Baranov A N, Tournié E. Semiconductor Lasers: fundamentals and applications, Woodhead Publishing, Cambridge, UK, Philadelphia, 2013. Chap.11, pp.441-486.
[3] Garbuzov D, Maiorov M, Lee H, Khalfin V, Martinelli R, Connolly J. Appl. Phys. Lett. 74, 1999, 2990-2992, http://dx.doi.org/10.1063/1.123989
[4] Hakki B W, Paoli T L. J. Appl. Phys. 46, 1975, 1299-1306, http://dx.doi.org/10.1063/1.321696
[5] Cassidy D T. J. Appl. Phys. 56, 1984, 3096-3099, http://dx.doi.org/10.1063/1.333867
[6] Shtengel G E, Belenky G L, Hyberstsen M S, Kazarinov R F, Ackerman D A. 9, 1998, 901-940, http://dx.doi.org/10.1142/S0129156498000385
[7] Kesler M P, Harder C. IEEE Photon. Technol. Lett. 2, 1990, 464-466, http://dx.doi.org/10.1109/68.56626
[8] Gordon E I. The Bell System Technical Journal. 43, 1964, 507-539, http://dx.doi.org/10.1002/j.1538-7305.1964.tb04076.x
[9] Tsvid G, Kirch J, Mawst L J, Kanskar M, Cai J, Arif R A, Tansu N, Smowton P M, Blood P. IEEE J. Quantum Electron. 44, 2008, 732-739, http://dx.doi.org/10.1109/JQE.2008.924242
[10] Oster A, Bugge F, Erbert G, Wenzel H. IEEE Journal of Selected Topics in Quantum Electronics. 5, 1999, 631-636, http://dx.10.1109/2944.788428
[11] Minch J, Park S H, Keating T, Chuang S L. IEEE J. Quantum Electron. 35, 1999, 771-782, http://dx.doi.org/ 10.1109/3.760325
[12] Hunziker G, Knop W, Unger P, Harder C. IEEE J. Quantum Electron. 31, 1995, 643-646, http://dx.doi.org/10.1109/3.371937
[13] Gupta J A, Barrios P J, Lapointe J, Aers G C, Storey C. Appl. Phys. Lett. 95, 2009, 1-3, http://dx.doi.org/10.1063/1.3189814
[14] Salhi A, Rouillard Y, Pérona A, Grech P, Garcia M, Sirtori C, Semicond. Sci. Technol. 19, 2004, 260-262, https://doi.org/10.1088/0268-1242/19/2/024
[15] Ramanujan S, Agrawal G P, Chwalek J M, Winful H. IEEE J. Quantum Electron. 32, 1996, 213-221, http://dx.doi.org/10.1109/3.481868
[16] Miller D.A.B. et al., Optical physics of quantum wells. In Quantum Dynamics of Simple Systems (Oppo, G.-L. et al.), Wilkinson, M., Eds., Institute of Physics: London, 1996, pp. 239–266
[17] Salhi A, Rouillard Y, Angellier J, Garcia M. IEEE Photonics Tech. Lett. 16, 2004, 2424-2426, http://dx.doi.org/10.1109/LPT.2004.835623
[18] Belenky G, Shterengas L, Kipshidze G, Hosoda T. IEEE Journal of Selected Topics in Quantum Electronics. 17, 2011, 1426-1434, http://dx.doi.org/10.1109/JSTQE.2011.2128300
[19] Pakulski G, Gupta J A, Barrios P J, Delage A, Poitras D, Wu X, E. E,Wasilewski Z R. SPIE Proceedings, 5577, 2004, 82-87, http://dx.doi.org/10.1117/12.567550
[20] Gadedjisso-Tossou K S, Belashene S, Mohou M A, E. Tournié, Rouillard Y. Semicond. Sci. Technol. 28, 2013, 1-6, http://dx.doi.org/10.1088/0268-1242/28/1/015015

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Published

2019-04-20

How to Cite

GADEDJISSO-TOSSOU, K. S.; DZAGLI, M. M.; MOHOU, M. A.; ROUILLARD, Y. DETERMINATION OF SPONTANEOUS EMISSION RATE AND CARRIER RECOMBINATION CHANNELS IN GaInAsSb/AlGaAsSb MULTIPLE QUANTUM WELL LASER DIODES EMITTING NEAR 2.3 µm. Journal of Fundamental and Applied Sciences, [S. l.], v. 11, n. 2, p. 901–913, 2019. DOI: 10.4314/jfas.v11i2.23. Disponível em: https://jfas.info/index.php/JFAS/article/view/379. Acesso em: 30 jan. 2025.

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